La0.7Sr0.3MnO3

In recent collaborative work with the Swiss partner (beamtine at the SIS beamline, Swiss Light Source, in December 2015) we measured by ARPES LSMO/BTO samples on STO substrates with thicknesses of 5/5, 4/4 and 40/20 ML. The films, grown by pulsed laser deposition (PLD) at the SIS beamline, were of very high quality as testified by RHEED and LEED patterns.

The analysis of the ARPES data shows that the LSMO film is a well-ordered monocrystal. We measured the Fermi surface in different Brillouin zones. The shape of the Fermi surface is in good agreement with the one measured on bulk LSMO confirming that a high quality LSMO crystal has been obtained on the BTO substrate.

Our previous work shows that using circularly polarized light a half-metallic LSMO, one can extract information on gap size of the conducting channel. (See arxiv 1806.01833 (2018))

back